/*////////////////////////////////////////////////////////////////////////
Copyright (c) 1994-2000 Yutaka Sato and ETL,AIST,MITI
Copyright (c) 2001 National Institute of Advanced Industrial Science and Technology (AIST)

Permission to use, copy, and distribute (via publically accessible
on-line media) this material for any purpose and without fee is hereby
granted, provided that the above copyright notice and this permission
notice appear in all copies.
AIST MAKES NO REPRESENTATIONS ABOUT THE ACCURACY OR SUITABILITY OF THIS
MATERIAL FOR ANY PURPOSE.  IT IS PROVIDED "AS IS", WITHOUT ANY EXPRESS
OR IMPLIED WARRANTIES.
////////////////////////////////////////////////////////////////////////*/
